MICROWAVE MEASUREMENTS OF DIELECTRIC PROPERTIES OF CORN VEGETATION AT C-BAND AND COMPARISON WITH DEBYE- COLE DUAL DISPERSION MODEL

Authors

  • Ashish B. Itolikar
  • M.L. Kurtadikar

DOI:

https://doi.org/10.1590/2179-10742017v16i41087

Keywords:

Corn leaves, dielectric constant, microwave remote sensing, Von Hipple method

Abstract

Microwave irradiations from vegetation canopy are strongly influenced by its dielectric properties and give useful information for microwave remote sensing -interpretation and applications. This paper reports on the laboratory measurements of dielectric properties of corn vegetation at C-Band frequency. Von Hipple method is used to measure complex dielectric properties using automated C-Band microwave bench set up. The least square fitting technique is used to calculate dielectric constant (ε'), dielectric loss (ε'') and errors in their measurements. The measured data is compared with Debye-Cole Dual Dispersion model. Emissivity and radiometric brightness temperature are theoretically estimated from measured dielectric properties at different angles of incidence for dry and moist corn leaves using Fresnel equations.Corn leaves

References

[1] Nelson, Stuart O. IEEE Trans. on Electrical Insulation. 1991 26(5), 845-869
[2] Francois, Tardieu; Thierry, Simonneau. Journal of Experimental Botany. 1998 49, 419–432
[3] Ferguson, Marvin H. USGA Journal and Turf management. 1959, 30-33.
[4] Fawwaz T, Ulaby; Mohamed A, EL-Rayes. IEEE Trans.on Geo. and Remote Sensing , 1987,GE-25(5) 550-557
[5] Kurtadikar, M.L.; Popalghat, S.K.; Mehrotra, S.C.2013, International Experts Meet on Microwave Remote Sensing,
Abstract-2, 16-17
[6] Deshpande, S.S.;Itolikar, A.B.;Joshi,A.S.,Kurtadikar,M.L. In Conference Proceedings: 11th International Conference
on Microwaves, Antena, Propagation & Remote Sensing ICMAR-2015,India, Dec.15-17,2015.
[7] Joshi, A.S.; Kurtadikar, M.L. Journal of Geomatics SAC-ISRO- The Journal of Indian society of Geomatics, 2013, 7(1),
33-40
[8] Itolikar, Ashish B.; Kurtadikar, M.L. Bionano Frontier, 2015 8(3), 371- 374.
[9] Itolikar, Ashish B.; Kurtadikar, M.L. Int. Journal of Advances in Remote Sensing and GIS, 2017, Vol.5, No.1, 58-66
[10] Kaatze, Udo. IOP publishing, Metrologia, 2010, 47, 91-113
[11] Von Hipple, A.R., Dielectric materials and Applications, New York, Wiley-1954.
[12] Griffiths, David J., Introduction to Electrodynamics, Prentice Hall, ISBN 0-13-805326-X, 390
[13] Kulkarni,P.G., Ph.D. Thesis submitted to Dr. Babasaheb Ambedkar Marathawada University,Aurangabad, India, 2006.

Downloads

Published

2019-09-30

How to Cite

Ashish B. Itolikar, & M.L. Kurtadikar. (2019). MICROWAVE MEASUREMENTS OF DIELECTRIC PROPERTIES OF CORN VEGETATION AT C-BAND AND COMPARISON WITH DEBYE- COLE DUAL DISPERSION MODEL. Journal of Microwaves, Optoelectronics and Electromagnetic Applications (JMOe), 16(4), 954–965. https://doi.org/10.1590/2179-10742017v16i41087

Issue

Section

Regular Papers