• Nawfal Jebbor
  • Seddik Bri




Complex permittivity, Rectangular waveguide, Thin materials, X band


An improved microwave method to extract the complex permittivity of solid and liquid materials filled in a short-circuited waveguide is developed. The method determines accurately the dielectric constant of thin and moderate thick samples. It eliminates the problems arising from any position offset of the dielectric slab in transmission / reflection methods. The proposed method is iterative and the initial value is calculated by using the 7th approximation order of trigonometric terms in the exact reflection coefficient equation. This approach is applied to the simulated data of low loss and dissipative materials in limited frequency band.


[1] D. Michali, C. Apollo, R. Pastore, and M. Marchetti, “X-Band microwave characterization of carbon-based
nanocomposite material, absorption capability comparaison and RAS design simulation,” Composites Science and
Technology, vol. 70, pp. 400-409, Nov. 2010.
[2] H. Ebara, T. Inoue, and O. Hashimoto, “Measurement method of complex permittivity and permeability for a powdered
material using a waveguide in microwave band,” Science and Technology of Advanced Materials, vol. 7, pp. 77-83,
Feb. 2006.
[3] U. C. Hasar, O. Simsek, M. K. Zateroglu, and A. E. Ekinci, “A microwave method for unique and non-ambiguous
permittivity determination of liquid materials from measured uncalibrated scattering parameters,” Progress In
Electromagnetics Research PIER, vol. 95, pp. 73-85, 2009.
[4] A. Mdarhri, M. Khissi, M. E. Achour, and F. Carmona, “Temperature effect on dielectric properties of carbon black
filled epoxy polymer composites,” Eur. Phys. J. Appl. Phys., vol. 41, pp. 215-220, Apr. 2008.
[5] L. F. Chen, C. K. Ong, C. P. Neo, V. V. Varadan, and V. K. Varadan, Microwave Electronics Measurement and
Material Characterization, John Willey and Sons, West Sussex, England, 2004, 37.
[6] C. P. Rubinguer, and L. C. Costa, “Building a resonant cavity for the measurement of microwave dielectric permittivity
of high loss materials,” Microwave Opt. Tech. Lett., vol. 49, pp. 1687-1690, July. 2007.
[7] E. Li, Z. P. Nie, G. Guo, Q. Zhang, Z. Li, and F. He, “Broadband measurements of dielectric properties of low-loss
materials at high temperatures using circular cavity method,” Progress In Electromagnetics Research, PIER, vol. 92,
pp. 103-120, 2009.
[8] N. Jebbor, S. Bri, L. Bejjit, A. Nakheli, M. Haddad, and A. Mamouni, “Complex permittivity determination with the
transmission / reflection method,” Int. J. Emerg. Sci., vol. 1(4), pp. 682-695, Dec. 2011.
[9] U. C. Hasar, “A fast and accurate amplitude-only transmission-reflection method for complex permittivity
determination of lossy materials,”IEEE Transactions on Microwave Theory and Techniques, vol. 56, pp. 2129-2135,
[10] U. C. Hasar, “Permittivity measurement of thin dielectric materials from reflection-only measurements using one-port
vector network analyzers,” Progress In Electromagnetics Research, PIER, vol. 95, pp. 365-380, 2009.
[11] U. C. Hasar, and O. Sismek, “An accurate complex permittivity method for thin dielectric materials,” Progress In
Electromagnetics Research, PIER, vol. 91, pp. 123-138, 2009.
[12] K. Sarabandi, and F. T. Ulaby, “Technique for measuring the dielectric constant of thin materials,” IEEE Transactions
on Instrumentation and Measurement, vol. 37 pp. 631-636, Dec. 1988.
[13] B. K. Chung, “Dielectric constant measurement for thin materials at microwave frequencies,” Progress In
Electromagnetics Research, PIER, vol. 75, pp. 239-252, 2007.
[14] J. Baker-Jarvis, Transmission/reflection and short-circuit line permittivity measurements, NIST Note 1341. U.S.
Government Printing Office, Washington, D.C., July 1990.
[15] C. A. Balanis, Advanced Engineering Electromagnetics, John Wiley & Sons, New Jersey, NJ, 1989.




How to Cite

Nawfal Jebbor, & Seddik Bri. (2012). A MICROWAVE METHOD FOR COMPLEX PERMITTIVITY EXTRACTION OF THIN MATERIALS. Journal of Microwaves, Optoelectronics and Electromagnetic Applications (JMOe), 11(2), 285 - 295. https://doi.org/10.1590/S2179-10742012000200006



Regular Papers