• José C. A. Santos
  • Maurício H. C. Dias
  • Alcino P. Aguiar
  • Itamar Borges Jr
  • Luiz E. P. Borges


thermal variables measurement, microwave measurements, permittivity measurement


The use of the Coaxial Probe Method for dielectric characterization of liquid materials and the cares that should be taken to make reliable permittivity measurements at high temperatures are described in this work. Due to the lack of a standard procedure in the literature for these measurements, the validation of the method involved the characterization of different liquids of known properties (water and alcohols) at different frequencies and temperatures. An experimental procedure was developed according to manufacturer's recommendations and our own experience in the lab. The reliability of the technique was evaluated by comparing the deviation of the measured results from material data in the literature with the accuracy limits supplied by the manufacturer of the probe.


J. M. Osepchuk, "Microwave Power Applications,`` IEEE Trans. on Microwave Theory and Techniques, vol. 50, no. 3, pp. 975-985, March 2002.

A. M. Sanseverino, "Microondas em Síntese Orgânica,`` Química Nova, vol. 25, no. 4, pp. 660-667, 2002 (in Portuguese).

Basics of Measuring Dielectric Properties of Materials, Application Note 5989-2589EN, Agilent Technologies Inc., 2006.

M. N. Afsar, R. J. Birch, R. N. Clarke, "The Measurement of the Properties of Materials,`` Proceedings of the IEEE, vol. 24, no. 1, pp. 183-199, January 1986.

Solutions for Measuring Permittivity and Permeability with LCR Meters and Impedance Analyzers, Application Note 1369-1, Agilent Technologies Inc., 2003.

Measurement of Dielectric Material Properties, Application Note RAC0607-0019, Rohde & Schwarz, 2006.

Agilent 85070E Dielectric Probe Kit 200 MHz to 20 GHz, Product Overview, Agilent Technologies Inc., 2003.

R. Nozaki and T. K. Bose, "Broadband Complex Permittivity Measurements by Time-Domain Spectroscopy,`` IEEE Trans. on Instrumentation and Measurement, vol. 39, no. 6, pp. 945-951, December 1990.

K. J. Bois, L. F. Handjojo, A. D. Benally, K. Mubarak, R. Zoughi, "Dielectric Plug-Load Two-Port Transmission Line Measurement Technique for Dielectric Property Characterization of Granular and Liquid Materials,`` IEEE Trans. on Instrumentation and Measurement, vol. 48, no. 6, pp. 1141-1148, December 1999.

Agilent 85071E Material Measurements Software, Technical Overview, Agilent Technologies Inc., 2003.

A. M. Boifot, "Broadband Method for Measuring Dielectric Constant of Liquid Using an Automatic Network Analyzer,`` IEE Proceedings, vol. 136, Pt. H, no. 6, pp. 492-498, December 1989.

M. Weiss and R. Knochel, "A Novel Method of Determining the Permittivity of Liquids,`` IEEE Trans. on Instrumentation and Measurement, vol. 49, no. 3, pp. 488-492, June 2000.

Agilent 85070D Dielectric Probe Kit, Product Overview, Agilent Technologies Inc., 2002.

D. V. Blackham and R. D. Pollard, "An Improved Technique for Permittivity Measurements Using a Csaxial Probe,`` IEEE Trans. on Instrumentation and Measurement, vol. 46, no. 5, pp. 1093-1099, October 1997.

Applying Error Correction to Network Analyzer Measurements, Application Note 1287-3, Agilent Technologies Inc., 2002.

A. Kraszewski, M. A. Stuchly, S. S. Stuchly, "ANA Calibration Method for Measurements of Dielectric Properties,`` IEEE Trans. on Instrumentation and Measurements, vol. 32, no. 2, pp. 385-386, June 1983.

U. Kaatze, "Reference Liquids for the Calibration of Dielectric Sensors and Measurement Instruments,`` Measurement Science and Technology, vol. 18, no. 2, pp. 967–976, February 2007.

T. Meissner and F. J. Wentz, "The Complex Dielectric Constant of Pure and Sea Water from Microwave Satellite Observations,`` IEEE Trans. on Geoscience and Remote Sensing, vol. 42, no. 9, pp. 488-492, September 2004




How to Cite

José C. A. Santos, Maurício H. C. Dias, Alcino P. Aguiar, Itamar Borges Jr, & Luiz E. P. Borges. (2009). USING THE COAXIAL PROBE METHOD FOR PERMITTIVITY MEASUREMENTS OF LIQUIDS AT HIGH TEMPERATURES. Journal of Microwaves, Optoelectronics and Electromagnetic Applications (JMOe), 8(1), 78S-91S. Retrieved from



Regular Papers